The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2009

Filed:

May. 10, 2006
Applicants:

Yoshikatsu Ichimura, Tokyo, JP;

Takashi Ushijima, Yokohama, JP;

Atsushi Kandori, Ebina, JP;

Yoshitaka Zaitsu, Kawasaki, JP;

Inventors:

Yoshikatsu Ichimura, Tokyo, JP;

Takashi Ushijima, Yokohama, JP;

Atsushi Kandori, Ebina, JP;

Yoshitaka Zaitsu, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/12 (2006.01); G03G 15/00 (2006.01); G03G 15/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A potential measuring device for measuring a potential of a measurement object, includes a detection electrode that faces the measurement object, a reference electrode disposed in a vicinity of the detection electrode that is electrostatically shielded by an electrostatic shield structure with respect to the measurement object, and capacitance modulator for modulating an electrostatic coupled capacitance between the detection electrode and the measurement object to measure a potential of the measurement object by using an electric signal generated on the detection electrode and an electric signal generated on the reference electrode.


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