The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2009
Filed:
Sep. 10, 2004
Claudio Cavalloni, Regensdorf, CH;
Kurt Vollenweider, Humlikon, CH;
Roland Sommer, Seuzach, CH;
Kistler Holding, AG, Winterthur, CH;
Abstract
A piezoelectric measuring element () consists of at least two piezoelectric crystals () showing a transversal effect for the measurement of axially acting forces and/or pressures as well as to a pressure or force sensor comprising said element. The crystals () with transversal effect having an opposite polarization () to each other are attached to each other by means of a lateral electrode (). In this manner, if n crystals () are attached to each other, a single multi-layer measuring element () is obtained with a stability under load which is n-times that of an individual crystal. Preferably, the electrodes extend alternately into the two force-absorbing end faces () of the crystals. Such measuring elements can be fabricated from wafers () in a cost-effective manner. A compact multi-layer measuring element prepared in this way can be easily mounted in a sensor, particularly a force or pressure sensor, without the risk of inclination.