The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2009
Filed:
Dec. 01, 2005
Sivaramanivas Ramaswamy, Karnataka, IN;
Michael Francis Xavier Gigliotti, Scotia, NY (US);
Vamshi Krishna Reddy Kommareddy, Karnataka, IN;
Richard Eugene Klaassen, West Chester, OH (US);
Edward James Nieters, Burnt Hills, NY (US);
Mandayam Tondanur Shyamsunder, Karnataka, IN;
Michael Everett Keller, Mason, OH (US);
Nihat Kurkcu, Istanbul, TR;
Sivaramanivas Ramaswamy, Karnataka, IN;
Michael Francis Xavier Gigliotti, Scotia, NY (US);
Vamshi Krishna Reddy Kommareddy, Karnataka, IN;
Richard Eugene Klaassen, West Chester, OH (US);
Edward James Nieters, Burnt Hills, NY (US);
Mandayam Tondanur Shyamsunder, Karnataka, IN;
Michael Everett Keller, Mason, OH (US);
Nihat Kurkcu, Istanbul, TR;
General Electric Compnay, Niskayuna, NY (US);
Abstract
A method and system for microstructural evaluation and degradation evaluation of an object are provided. The method comprises insonifying at least one subvolume of the object with ultrasonic energy at a fundamental frequency and acquiring receive energy from the object at the fundamental frequency and at least one harmonic frequency thereof. A nonlinearity parameter is determined using the receive energy. The nonlinearity parameter is then used to determine a grain size for the subvolume of the object and a variation of the grain size within the object. The nonlinearity parameter is also used to determine fatigue damage or a residual stress.