The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2009

Filed:

Sep. 03, 2004
Applicants:

Andreas Blumenthal, Heidelberg, DE;

Mirko Luedde, Hildesheim, DE;

Thomas Manzke, Bensheim, DE;

Bjoern Mielenhausen, Sandhausen, DE;

Christiaan E. Swanepoel, Heidelberg, DE;

Inventors:

Andreas Blumenthal, Heidelberg, DE;

Mirko Luedde, Hildesheim, DE;

Thomas Manzke, Bensheim, DE;

Bjoern Mielenhausen, Sandhausen, DE;

Christiaan E. Swanepoel, Heidelberg, DE;

Assignee:

Sap Aktiengesellschaft, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01); G06F 9/46 (2006.01); G06F 9/44 (2006.01); G06F 9/45 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus, including computer program products, for measuring the performance of aspects of a complex data processing system. In one aspect, a method uses a dynamic synthetic benchmark to provide performance information for a program application running on a virtual machine. The benchmark in one implementation uses a load profile that includes information about instructions that make up the application, their call frequencies, and their workloads. Microbenchmarks of individual virtual machine instructions provide performance information about the virtual machine that is used with the load profile to synthesize a performance benchmark for the application.


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