The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2009

Filed:

Jan. 18, 2006
Applicants:

Hans-jürgen Euler, Heerbrugg, CH;

Craig D. Hill, Balgach, CH;

Inventors:

Hans-Jürgen Euler, Heerbrugg, CH;

Craig D. Hill, Balgach, CH;

Assignee:

Leica Geosystems AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The aim of the invention is to limit the number of possible phase ambiguity resolutions when taking measurements by means of satellite-aided positioning systems. Said aim is achieved by a method which allows the search sector to be better restricted. To this avail, information about the geometry of an antenna array is used for establishing restrictions for said antenna array. Said restrictions allow the search sector and thus the number of acceptable resolutions to be successively reduced. A restriction comprises the utilization of the connecting line between two antennas (A, A) that define a primary base line (S). An additional, secondary base line (S) can be calculated by inventively parameterizing the degree of rotational freedom of said secondary base line (S) about the primary base line (S) such that the process is accelerated.


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