The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2009

Filed:

Sep. 24, 2004
Applicants:

Gereon Vogtmeier, Aachen, DE;

Francisco Morales Serrano, Eindhoven, NL;

Inventors:

Gereon Vogtmeier, Aachen, DE;

Francisco Morales Serrano, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/30 (2006.01); H05G 1/60 (2006.01); G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray unit according to the invention has a first arrangement () that is intended for the contactless and X-ray free measurement of first data of an object (). A control unit () controls, on the basis of the first data of the object, a second arrangement () that measures X-ray data of the object by means of X-rays. With such an X-ray unit, first dataof the object can be obtained without using X-rays and control of the measurement of the X-ray data is made possible, with the result that, for the optimum quality of the X-ray data, only a minimum X-ray dose is applied to the object.


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