The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2009
Filed:
Feb. 13, 2007
Stewart Arthur Levin, Centennial, CO (US);
Stewart Arthur Levin, Centennial, CO (US);
Landmark Graphics Corporation, Houston, TX (US);
Abstract
A method for analyzing seismic data from a formation. The method may first receive two-dimensional (2-D) seismic data of a formation comprising a number of individual seismic lines acquired over an exploration area and having a large interline spacing. The 2-D seismic data may then be preprocessed to enhance diffracted energy. For each respective hypothetical diffractor location, the method may then search for coherent diffraction arrivals on nearby 2-D seismic lines consistent with the respective hypothetical diffractor location. The method may then store information regarding identified diffractor locations. The method may then create a map based on the identified diffractor locations, wherein the map illustrates areas of high diffraction. The map may then be displayed on a display, wherein the map is useable to assess the formation.