The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2009
Filed:
May. 18, 2004
Eric M. Gross, Rochester, NY (US);
Joseph A. Mastrandrea, Webster, NY (US);
James M. Pacer, Webster, NY (US);
David R. Stookey, Rochester, NY (US);
Soon K. Kuek, Fairport, NY (US);
Eric S. Hamby, Fairport, NY (US);
Eric M. Gross, Rochester, NY (US);
Joseph A. Mastrandrea, Webster, NY (US);
James M. Pacer, Webster, NY (US);
David R. Stookey, Rochester, NY (US);
Soon K. Kuek, Fairport, NY (US);
Eric S. Hamby, Fairport, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A method and apparatus for implementing statistical process control (SPC) in a printing environment to address errant reads of control sensors is provided. The system uses SPC, in systems having feedback control based on control sensor data, to identify errant reads and ensure that such errant reads are not used in the applicable feedback loop. Unnecessary reaction to the errant reads is thus avoided.