The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7545516 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 09, 2009

Filed:

Dec. 01, 2006
Applicants:

Peirong Jia, Ottawa, CA;

Jonathan David Kofman, London, CA;

Chad English, Ottawa, CA;

Inventors:

Peirong Jia, Ottawa, CA;

Jonathan David Kofman, London, CA;

Chad English, Ottawa, CA;

Assignee:

University of Waterloo, Ontario, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for full-field fringe-projection for 3-D surface-geometry measurement, referred to as 'triangular-pattern phase-shifting' is disclosed. A triangular grey-scale-level-coded fringe pattern is computer generated, projected along a first direction onto an object or scene surface and distorted according to the surface geometry. The 3-D coordinates of points on the surface are calculated by triangulation from distorted triangular fringe-pattern images acquired by a CCD camera along a second direction and a triangular-shape intensity-ratio distribution is obtained from calculation of the captured distorted triangular fringe-pattern images. Removal of the triangular shape of the intensity ratio over each pattern pitch generates a wrapped intensity-ratio distribution obtained by removing the discontinuity of the wrapped image with a modified unwrapping method. Intensity ratio-to-height conversion is used to reconstruct the 3-D surface coordinates of the object. Intensity-ratio error compensation involves estimating intensity-ratio error in a simulation of the measurement process with both real and ideal captured triangular-pattern images obtained from real and ideal gamma non-linearity functions. A look-up table relating the measure intensity-ratio to the corresponding intensity-ratio error is constructed and used for intensity-ratio error compensation. The inventive system is based on two-step phase-shifting but can be extended for multiple-step phase-shifting.


Find Patent Forward Citations

Jia, Peirong. (2009). Full-field three-dimensional measurement method (U.S. Patent No. 7545516). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7545516

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