The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2009

Filed:

Sep. 14, 2006
Applicants:

Swaminathan Manickam, Bellingham, MA (US);

John P. Konicek, Minneapolis, MN (US);

David W. Duquette, Minneapolis, MN (US);

Steven K. Case, St. Louis Park, MN (US);

Inventors:

Swaminathan Manickam, Bellingham, MA (US);

John P. Konicek, Minneapolis, MN (US);

David W. Duquette, Minneapolis, MN (US);

Steven K. Case, St. Louis Park, MN (US);

Assignee:

CyberOptics Corporation, Golden Valley, MN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); G01B 11/14 (2006.01); G01B 11/04 (2006.01); G01B 11/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A pick and place machine includes a sensor disposed to acquire an image of a nozzle before a pick operation, and one or more images after the pick operation. Image analytics based upon these images reveal important characteristics that can be used to classify the pick operation. In some embodiments, a plurality of after-pick images are acquired at different poses (angular orientations).


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