The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2009
Filed:
Jun. 17, 2005
Applicants:
Noriaki Kaneki, Hokkaido, JP;
Toshihiko Imato, Fukuoka, JP;
Akihide Hemmi, Tokyo, JP;
Katsumi Uchiyama, Tokyo, JP;
Yasukazu Asano, Saitama, JP;
Kouji Shimada, Hokkaido, JP;
Inventors:
Noriaki Kaneki, Hokkaido, JP;
Toshihiko Imato, Fukuoka, JP;
Akihide Hemmi, Tokyo, JP;
Katsumi Uchiyama, Tokyo, JP;
Yasukazu Asano, Saitama, JP;
Kouji Shimada, Hokkaido, JP;
Assignees:
Muroran Institute of Technology, Mizumoto-cho, Muranran-shi, Hokkaido, JP;
Kyushu University, National University Corp., Hakozaki, Higashi-ku, Fukuoka-shi, Fukuoka, JP;
Meblus Advanced Technology Ltd., Nishiogi-kita, Suginami-ku, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention discloses surface plasmon resonance phenomenon measuring equipment comprising: