The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2009
Filed:
Apr. 12, 2006
Applicants:
James L. Overbeck, Ada, MI (US);
Richard J. Van Andel, Grand Rapids, MI (US);
Inventors:
James L. Overbeck, Ada, MI (US);
Richard J. Van Andel, Grand Rapids, MI (US);
Assignee:
X-Rite, Inc., Grand Rapids, MI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for measuring a flexible colored material during a manufacturing process. The method includes automatically diverting the flexible material from a process path, placing the flexible material in contact with a rotatable drum, and measuring spectral data of the flexible material as the drum rotates. Measuring the spectral data includes scanning the flexible material with a line scanning detector having an array of detectors. The method also includes processing scan information to form a single image of the flexible material.