The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2009
Filed:
Sep. 26, 2005
Weng-bing Chou, Gueishan Township, Taoyuan County, TW;
Weng-Bing Chou, Gueishan Township, Taoyuan County, TW;
AU Optronics Corporation, Hsin-Chu, TW;
Abstract
Metal-Insulator-Metal (MIM) diodes in back-to-back thin film diode (TFD) liquid crystal display (LCD) device are formed on dual selective lines respectively. A transparent conductive layer on a first substrate comprises a pixel electrode, a first bottom layer, a second bottom layer, a third bottom layer, and a fourth bottom layer. A semiconductor insulator layer with a first contact hole on the first bottom layer and a second contact hole on the third bottom layer covers the first substrate and the transparent conductive layer. A metal conductive layer comprises a first selective line, a second selective line, a first top layer, and a second top layer, wherein an overlapped region between the first bottom layer and the first top layer is a first MIM diode, an overlapped region between the second bottom layer and the first top layer is a second MIM diode, an overlapped region between the third bottom layer and the second top layer is a third MIM diode, and an overlapped region between the fourth bottom layer and the second top layer is a fourth MIM diode. The first selective line electrically connects to the first bottom layer via the first contact hole, and the second selective line electrically connects to the third bottom layer via the first contact hole. The first and second top layers respectively isolated to the first and second selective lines are in the conformation of the first and second selective lines respectively.