The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2009

Filed:

Jul. 17, 2006
Applicants:

Jeffery Steven Beck, Denver, CO (US);

Yan Ping Lim, Denver, CO (US);

Ray Alan Mentzer, Denver, CO (US);

Inventors:

Jeffery Steven Beck, Denver, CO (US);

Yan Ping Lim, Denver, CO (US);

Ray Alan Mentzer, Denver, CO (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/217 (2006.01); H04N 9/64 (2006.01); H04N 5/335 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image sensor device is provided that has an uncovered imaging array of pixels and a covered global reference non-imaging array of pixels. The pixel samples of the global reference non-imaging array are used to remove noise from the pixel samples of the imaging array. The control signals and control lines that are used to sample the pixels of the imaging array are separate from and independent of the control signals and control lines that are used to sample the pixels of the global reference non-imaging array of pixels. For each row of pixels of the imaging array that is sampled, the same row of pixels of the global reference non-imaging array is sampled. The global reference row has no or very few offsets or variations to ensure that noise removal is performed effectively.


Find Patent Forward Citations

Loading…