The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2009
Filed:
Jan. 11, 2007
Evan Grund, San Jose, CA (US);
Evan Grund, San Jose, CA (US);
Thermo Fisher Scientific, Inc., Fremont, CA (US);
Abstract
A Transmission Line Pulse ('TLP') measurement system for testing devices such as integrated circuits ('ICs'), and especially for testing the electrostatic discharge (“ESD”) protection structures connected to terminals on such ICs. The TLP measurement system measures the pulsed voltage and/or current of a device under test (“DUT”) by recording voltage and/or current pulse waveforms traveling in a constant impedance cable to and from the DUT. The pulses going to and returning from the DUT are processed to create signal replicas of the voltage and current pulses that actually occurred at the DUT. Oscilloscope operating settings optimize the recording of these signal replicas by improving the measurement signal-to-noise ratio. This improved TLP system is especially useful when very short width pulses on the order of less than 10 nanoseconds are used to test the DUT's response.