The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2009
Filed:
Jul. 11, 2006
Hisashi Matsumoto, Hillsboro, OR (US);
Mark Singer, Tualatin, OR (US);
Leo Baldwin, Portland, OR (US);
Jeffrey E. Howerton, Portland, OR (US);
David V. Childers, Portland, OR (US);
Hisashi Matsumoto, Hillsboro, OR (US);
Mark Singer, Tualatin, OR (US);
Leo Baldwin, Portland, OR (US);
Jeffrey E. Howerton, Portland, OR (US);
David V. Childers, Portland, OR (US);
Electro Scientific Industries, Inc., Portland, OR (US);
Abstract
A process for laser forming a blind via in at least one layer of a circuit substrate having a plurality of capture pads of varying geometry can include, for at least one blind via to be formed in at least one layer of a circuit substrate, evaluating a capture pad geometry value (such as area and/or volume) within a predetermined distance from a drilling location with respect to a blind via geometry value (such as area and/or volume) to be formed at the drilling location. The process can include setting at least one laser operating parameter based on the evaluation in order to obtain a desired capture pad appearance after blind via formation. The process can include imaging a capture pad area defined as an area within a predetermined distance from a blind via drilling location in at least one layer of a circuit substrate, quantifying at least one appearance value for the imaged capture pad area, and determining an acceptability of the imaged capture pad areas based on the quantified appearance value.