The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2009

Filed:

Sep. 27, 2007
Applicants:

Lei LI, Shenzhen, CN;

Ping Chen, Shenzhen, CN;

Zhi Cheng, Shenzhen, CN;

HU LI, Shenzhen, CN;

Dong LI, Shenzhen, CN;

Yong-zhi Tao, Shenzhen, CN;

Lin-sen Dong, Shenzhen, CN;

Inventors:

Lei Li, Shenzhen, CN;

Ping Chen, Shenzhen, CN;

Zhi Cheng, Shenzhen, CN;

Hu Li, Shenzhen, CN;

Dong Li, Shenzhen, CN;

Yong-Zhi Tao, Shenzhen, CN;

Lin-Sen Dong, Shenzhen, CN;

Assignees:

Shenzhen Futaihong Precision Industry Co., Ltd., ShenZhen, Guangdong Province, CN;

FIH (Hong Kong) Limited, Kowloon, HK;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A failure analysis system () for printed circuit board () includes testing equipment () and a monitor (). The testing equipment includes a base (), a fixing body (), a supporting arm () and a micrometer (). The fixing body and the supporting arm are both firmly fixed on the base. The printed circuit board is fastened to the fixing body. The micrometer is slidingly attached to the supporting arm. The micrometer has a pin () at one end thereof for resisting one end of the printed circuit board. The monitor electronically connects with the printed board for receiving signals from the printed circuit board. When the pin of the micrometer reaches a certain position, the signal transmitted to the monitor is broken.


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