The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7543491 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 09, 2009

Filed:

Sep. 19, 2007
Applicants:

Dirk Hammerschmidt, Villach, AT;

Terje Kvisteroey, Horten, NO;

Inventors:

Dirk Hammerschmidt, Villach, AT;

Terje Kvisteroey, Horten, NO;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60C 23/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to systems and methods for detecting and monitoring tire deformation. In one embodiment, a tire deformation detection system comprises a first electrode, a second electrode, circuitry, and a central control unit. The first electrode is coupled to an interior surface of a tire. The second electrode is coupled to an interior surface of the tire and configured with the first electrode to form a first capacitor. The circuitry is configured to measure a first capacitance of the first capacitor. The central control unit is configured to detect a deformation of the tire based at least in part on the first capacitance.


Find Patent Forward Citations

Hammerschmidt, Dirk. (2009). Capacitive measurement of tire deformation (U.S. Patent No. 7543491). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7543491

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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