The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2009

Filed:

Feb. 27, 2007
Applicants:

Masashi Kitazawa, Ina, JP;

Masaki Tanemura, Owariasahi, JP;

Junya Tanaka, Aichi, JP;

Tatsuhiko Okita, Hachioji, JP;

Inventors:

Masashi Kitazawa, Ina, JP;

Masaki Tanemura, Owariasahi, JP;

Junya Tanaka, Aichi, JP;

Tatsuhiko Okita, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G12B 21/08 (2006.01); B82B 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A carbon thin line probe having a carbon thin line selectively formed at a projection-like terminal end portion thereof by means of an irradiation of high-energy beam, the carbon thin line internally containing a metal. Thereby achieved is a carbon thin line probe suitable for example for the probe of SPM cantilever, which has a high aspect ratio and high durability and reliability, capability of batch processing based on a simple manufacturing method, and to which magnetic characteristic can be imparted.


Find Patent Forward Citations

Kitazawa, Masashi. (2009). Carbon thin line probe (U.S. Patent No. 7543482). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7543482

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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