The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2009
Filed:
May. 23, 2006
Loren Dean, Natick, MA (US);
Michael J. Thomas, Framingham, MA (US);
Loren Dean, Natick, MA (US);
Michael J. Thomas, Framingham, MA (US);
The MathWorks, Inc., Natick, MA (US);
Abstract
A mechanism for the distribution of a test vector for a system test to a parallel computing environment is discussed. A test vector which controls the parameterization of a system test being conducted is provided as an input parameter to a function. In one implementation, the test vector is declared as a distributed array data type. The processing of the input test vector parameter causes the test vector to be distributed to the parallel computing units holding portions of the system under test. The test vector is then used in executing the system test. The results of the execution of the system test using the test vector may then be saved in a distributed array or returned to a client for presentment to a user.