The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2009

Filed:

Apr. 05, 2006
Applicants:

Yuichiro Hashimoto, Tokyo, JP;

Hideyuki Kawanabe, Tokyo, JP;

Inventors:

Yuichiro Hashimoto, Tokyo, JP;

Hideyuki Kawanabe, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope includes a switching mechanism which has a plurality of lens units, and which inserts a selected lens unit of the plurality of lens units into an observation light path and disposes the non-selected other lens units outside the observation light path. A control unit controls a movement speed of a stage, onto which a sample is placed, in an optical axis direction according to an observation power of the selected lens unit inserted into the observation light path. The plurality of lens units include: (i) a plurality of fixed-power lens units which are lens units including a combination of imaging lenses and objective lenses, and whose observation powers when observing the sample mutually differ, and (ii) a zoom lens unit which has a continuously changeable observation power.


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