The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2009
Filed:
Aug. 11, 2006
Hyung-soo Kim, Suwon-si, KR;
Woo-kyu Kim, Suwon-si, KR;
Hyung-soo Kim, Suwon-si, KR;
Woo-kyu Kim, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Abstract
A tandem laser scanning unit (LSU) is provided. The tandem LSU includes a light source, a beam deflector, and an optical scanning lens. The beam deflector rotates on a light-emitting path of the light source to simultaneously deflect different light beams obliquely incident at a predetermined angle to each other within a sub-scanning plane substantially parallel to the rotational axis of the beam deflector. The optical scanning lens allows the light beams deflected by the beam deflector to be condensed on corresponding photosensitive drums. The optical scanning lens includes at least one sub-scanning cross-section having an aspherical surface to reduce the curvature of a scanning line. Using the tandem LSU, the distortion and curvature of the scanning line are corrected while providing an oblique incidence optical system having advantages in terms of manufacturing costs and driving efficiency.