The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2009
Filed:
Oct. 02, 2006
Masahiro Toida, Kanagawa-ken, JP;
Karin Kawahara, Kanagawa-ken, JP;
Masahiro Toida, Kanagawa-ken, JP;
Karin Kawahara, Kanagawa-ken, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Light emitted from a light source is divided into measuring light and reference light. The reflected light from the object and the reference light are superposed. Interference light of the reflected light and reference light which have been superposed is detected. Intensities of the reflected light in a plurality of positions in the direction of depth of the object are detected on the basis of the frequency and the intensity, and a tomographic image of the object is obtained on the basis of the intensity of the reflected light in each position in the direction of depth. A compensating signal is obtained by removing the spectral components of the measuring light from an interference signal obtained by detection of the interference light, and the compensating signal is provided for detection of the intensities of the reflected light after a Gaussian transform.