The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2009
Filed:
Nov. 30, 2007
Toshihiko Ouchi, Sagamihara, JP;
Shintaro Kasai, Tokyo, JP;
Haruko Yoneyama, Saitama, JP;
Masatsugu Yamashita, Sendai, JP;
Toshihiko Ouchi, Sagamihara, JP;
Shintaro Kasai, Tokyo, JP;
Haruko Yoneyama, Saitama, JP;
Masatsugu Yamashita, Sendai, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Riken, Saitama-Ken, JP;
Abstract
A detection apparatus includes a sample holding section, an irradiation means, a detection means, a calculation means, and an evaluation means. The irradiation means irradiates a substance held in the sample holding section with a THz wave. The detection unit detects a THz wave that has passed through or been reflected from the substance. The calculation unit determines a frequency dependence of a property of the substance with respect to the irradiated THz wave and then calculates a slope of a straight line or a slope of a straight line obtained by straight-line approximation of the frequency dependence of the property of the substance. The evaluation unit evaluates the state change of the substance by comparing a previously-obtained slope of a straight line of the frequency dependence of the property of the substance in a standard state and the slope of the straight line of the substance calculated.