The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7542132 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 02, 2009

Filed:

Jul. 30, 2007
Applicants:

Hongbin Fang, San Jose, CA (US);

Josh Golden, Santa Cruz, CA (US);

Timothy W. Weidman, Sunnyvale, CA (US);

Yaxin Wang, Fremont, CA (US);

Arulkumar Shanmugasundram, Sunnyvale, CA (US);

Inventors:

Hongbin Fang, San Jose, CA (US);

Josh Golden, Santa Cruz, CA (US);

Timothy W. Weidman, Sunnyvale, CA (US);

Yaxin Wang, Fremont, CA (US);

Arulkumar Shanmugasundram, Sunnyvale, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring the concentration of the metal solution and reducing agent solution within the electroless plating solution is disclosed. Raman spectroscopy is used to measure the concentration of each solution within the electroless plating solution after they have been mixed together. By measuring the concentration of each solution prior to providing the solution to a plating cell, the concentration of the individual solutions can be adjusted so that the targeted concentration of each solution is achieved. Additionally, each solution can be individually analyzed using Raman spectroscopy prior to mixing with the other solutions. Based upon the Raman spectroscopy measurements of the individual solutions prior to mixing, the individual components that make up each solution can be adjusted prior to mixing so that the targeted component concentration can be achieved.


Find Patent Forward Citations

Fang, Hongbin. (2009). Raman spectroscopy as integrated chemical metrology (U.S. Patent No. 7542132). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7542132

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