The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2009
Filed:
May. 17, 2006
Dean R. Marshall, Tucson, AZ (US);
David J. Knapp, Tucson, AZ (US);
Dean R. Marshall, Tucson, AZ (US);
David J. Knapp, Tucson, AZ (US);
Raytheon Company, Waltham, MA (US);
Abstract
A radio-frequency-device test range (the Refractive Compact Range) includes a physical space having a source zone for placing an antenna or array of antennas, and a test zone for placing a sensor or other device to be tested. A lens and an apodizer are placed in the physical space between the source zone and the test zone. The lens serves to collimate radiated energy emanating from the antenna toward the test zone. The lens may have a surface treatment, such as an anti-reflective coating or a surface pattern, on one or both surfaces. The apodizer functions to keep energy from diffracting off the edge of the lens and getting into the field of view (the test zone). The sensor or other device to be tested may be placed on a moveable mount to allow it to be moved, to simulate relative movement of the device and a radio frequency source, such as radiated by an antenna.