The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2009
Filed:
Jul. 07, 2006
Hirofumi Kosaka, Ishikawa, JP;
Kazuhiko Ikeda, Ishikawa, JP;
Shoichi Kajiwara, Osaka, JP;
Hiroyuki Tani, Osaka, JP;
Yoichiro Ueda, Osaka, JP;
Atsushi Yamamoto, Kyoto, JP;
Hirofumi Kosaka, Ishikawa, JP;
Kazuhiko Ikeda, Ishikawa, JP;
Shoichi Kajiwara, Osaka, JP;
Hiroyuki Tani, Osaka, JP;
Yoichiro Ueda, Osaka, JP;
Atsushi Yamamoto, Kyoto, JP;
Panasonic Corporation, Osaka, JP;
Abstract
In order to direct a probe having directivity that a received band is widened in accordance with a measurement distance, toward a DUT, shift the received band of the probe in sequence, receive electromagnetic, and measure electromagnetic interference, a plurality of long and short measurement distances between the probe and the DUT are set, and measurement at the long measurement distance and measurement at the short measurement distance are performed plural times. Herein, the measurement at the short measurement distance is performed on a received band where electromagnetic interference is measured by the measurement at the long measurement distance. Thus, measurement of electromagnetic interference can be performed with high accuracy in a short time.