The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
Mar. 31, 2008
Thomas Jack Geraint Bailey, Eastleigh, GB;
Ian Derek Heritage, Eastleigh, GB;
Michael Anthony Ricketts, Romsey, GB;
James Clive Stewart, Evesham, GB;
Thomas Jack Geraint Bailey, Eastleigh, GB;
Ian Derek Heritage, Eastleigh, GB;
Michael Anthony Ricketts, Romsey, GB;
James Clive Stewart, Evesham, GB;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus for concurrency testing within a model-based testing environment is provided. One implementation involves concurrency testing within a model-based software system testing environment, by receiving concurrent test service requests; duplicating a model representing software under test, based on the number of requests; sending the concurrent requests to each of the duplicated models sequentially but in different orders; storing the outcomes of each of the models; comparing the outcomes from the models to the outcome from the software system under test; and if all comparisons fail, then indicating test failure.