The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
Jul. 05, 2006
Chien-cheng Chang, Taipei, TW;
Cheng-yuan Wu, Taipei, TW;
Chien-Cheng Chang, Taipei, TW;
Cheng-Yuan Wu, Taipei, TW;
Via Technologies, Inc., Taipei, TW;
Abstract
Circuit and method for testing digital logic circuit modules of an integrated circuit chip. The circuit includes a storage device, a first multiplexing module and a selection device. The storage device stores first, second, third and fourth N-bit groups of a test pattern separately according to a loading signal and an address selection signal. The first multiplexing module is coupled to the storage device and a first digital logic circuit module, for parallel transmitting the first, second, third and fourth N-bit groups which will be received and executed by the first digital logic circuit module to parallel generate first, second and third M-bit groups. The selection device is coupled to the first digital logic circuit module for sequentially selecting one of the first, second and third M-bit groups to output a first test result according to the address selection signal.