The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
Oct. 29, 2004
Mi-sook Jang, Daejun, KR;
Hoi-jin Lee, Sungnam, KR;
Mi-Sook Jang, Daejun, KR;
Hoi-Jin Lee, Sungnam, KR;
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Abstract
A semiconductor test apparatus for determining memory failure, including a first at least one multiplexer. The first at least one multiplexer may include a first transistor and a second transistor, the first transistor and the second transistor being different sizes. The semiconductor may include a scan cell, the scan cell including a second at least one multiplexer. The second at least one multiplexer may include a third transistor and a fourth transistor, the third transistor and the fourth transistor being different sizes. Another semiconductor test apparatus including a plurality of scan cells and a plurality of multiplexers, each of the plurality of scan cells and the plurality of multiplexers formed in a single wrapper.