The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
Apr. 13, 2006
Applicants:
Niranjan Behera, Fremont, CA (US);
Bruce L. Prickett, Jr., Fremont, CA (US);
Inventors:
Niranjan Behera, Fremont, CA (US);
Bruce L. Prickett, Jr., Fremont, CA (US);
Assignee:
Virage Logic Corp., Fremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for testing a memory at speed. A test and repair wrapper integrated with a memory instance is operable to receive test information scanned in from a built-in self-test and repair (BISTR) processor. Logic circuitry associated with the test and repair wrapper is operable to generate address, data and command signals based on the scanned test information, wherein the signals are used for effectuating one or more tests with respect to the memory instance.