The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
Jan. 14, 2005
Applicants:
Chin-yin Tsai, Taipei, TW;
Shih-fang Chen, Taipei, TW;
Yi-lin Lai, Taipei, TW;
Inventors:
Assignee:
Tian Holdings, LLC, Wilmington, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides a method for detecting disk defects of a blank optical disk in a recording and reproducing system when a data-recording operation is performed. In the embodiment, an ATIP and the carrier signal of the ATIP signal, ATFM signals, are compared to obtain a difference between these two signals. A wobble defect flag signal is set if the difference keeps higher than a predetermined threshold for a predetermined time interval. On the contrary, the wobble defect flag signal is cleared if the difference keeps lower than the predetermined threshold for the predetermined time interval.