The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2009

Filed:

Jul. 21, 2008
Applicants:

David J. Zahniser, Wellesley, MA (US);

Matthew S. Zelinski, Worthington, OH (US);

Thomas M. Dolash, Worthington, OH (US);

Garrick L. Maenle, Columbus, OH (US);

Mark Fleming, Columbus, OH (US);

John S. Laudo, Columbus, OH (US);

Inventors:

David J. Zahniser, Wellesley, MA (US);

Matthew S. Zelinski, Worthington, OH (US);

Thomas M. Dolash, Worthington, OH (US);

Garrick L. Maenle, Columbus, OH (US);

Mark Fleming, Columbus, OH (US);

John S. Laudo, Columbus, OH (US);

Assignee:

Cytyc Corporation, Marlborough, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G02B 21/06 (2006.01); G01N 21/00 (2006.01); G01N 21/75 (2006.01); F21V 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to the analysis of cytological material. Specifically, the invention relates to stains and methods of producing the stains, methods of staining cells for cytological or histological analysis to contrast the nuclear portion of the cell from the cytoplasmic portion, and systems and methods for illuminating a cytological sample. The analysis can be automated or manual.


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