The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2009

Filed:

Nov. 07, 2006
Applicant:

Wayne E. Shanks, Baltimore, MD (US);

Inventor:

Wayne E. Shanks, Baltimore, MD (US);

Assignee:

Symbol Technologies, Inc., Holtsville, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 13/14 (2006.01); H04Q 5/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, systems, and apparatuses for RFID devices, such as tag test methods, are described. A tag of a strip of tags is positioned adjacent to an opening in an electrically conductive sheet, the tag having first and second orthogonally polarized antennas. A first RF test signal is transmitted through the opening to test the first antenna of the tag. The tag is positioned such that the first RF test signal has a polarization substantially the same as the first antenna and substantially orthogonal to a polarization of the second antenna. A second RF test signal is transmitted through the opening to test the second antenna of the tag. The tag is positioned such that the second RF test signal has a polarization substantially the same as the second antenna and substantially orthogonal to the polarization of the first antenna. If proper responses to both of the first and second RF test signals are received, the tag has passed the test. This test may be repeated for further tags in the strip of tags as desired.


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