The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2009

Filed:

Aug. 07, 2007
Applicant:

Hideki Murakami, Toyota, JP;

Inventor:

Hideki Murakami, Toyota, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60C 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A wheel condition detector and a wheel condition monitor, each having a case provided in an internal space defined between a tire and a wheel member, the tire and the wheel member forming a wheel. The case has a detection space formed therein and a communication section for communicating an interior and an exterior of the detection space with each other. The wheel condition detector or the wheel condition monitor has: a condition sensor located in the detection space that detects a condition of the wheel; and a restriction section that restricts an entry of foreign matter present in the internal space into the detection space through the communication section.


Find Patent Forward Citations

Murakami, Hideki. (2009). Wheel condition detector and wheel condition monitor (U.S. Patent No. 7538660). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7538660

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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