The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
Oct. 18, 2006
Jonathan S. Ehrmann, Sudbury, MA (US);
Patrick S. Duffy, N. Andover, MA (US);
Markus M. Weber, Malden, MA (US);
Gregg A. Metzger, Andover, MA (US);
Joseph V. Lento, Methuen, MA (US);
Pierre-yves Mabboux, Billerica, MA (US);
Jens Zink, Lakeville, MA (US);
Yun Fee Chu, Natick, MA (US);
Jonathan S. Ehrmann, Sudbury, MA (US);
Patrick S. Duffy, N. Andover, MA (US);
Markus M. Weber, Malden, MA (US);
Gregg A. Metzger, Andover, MA (US);
Joseph V. Lento, Methuen, MA (US);
Pierre-Yves Mabboux, Billerica, MA (US);
Jens Zink, Lakeville, MA (US);
Yun Fee Chu, Natick, MA (US);
GSI Group Corporation, Bedford, MA (US);
Abstract
A laser processing system implements a method for aligning a probe element (e.g., a probe pin) with a device interface element (e.g., a contact pad of a circuit substrate). First, the laser processing system generates an optical reference beam at one or more predetermined positions to calibrate a reference field. The laser processing system then detects a position of the probe element in the reference field. The laser processing system also determines a relative position of the device interface element in the reference field. Based on the position of the probe element and the device interface element, the laser processing system then initiates alignment of the probe element and the device interface element. In one application, alignment of the probe element and the device interface element further includes contacting the probe element to the device interface element to make an electrical connection.