The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
Jul. 23, 2003
Yoshiharu Sato, Kyoto, JP;
Koji Katsuki, Kyoto, JP;
Yoshiharu Sato, Kyoto, JP;
Koji Katsuki, Kyoto, JP;
ARKRAY, Inc., Kyoto, JP;
Abstract
This invention relates to a technique for analyzing a sample. A sample analyzer () provided by the invention includes: a voltage applier () for applying a voltage to a reaction field which includes a sample; a response measurer () for measurement of a response to the voltage applied to the reaction field; a selector () for selecting a first voltage application state for measurement of a first response for use in calculation necessary for analyzing the sample or a second voltage application state for measurement of a second response for use in determining whether or not the reaction field has been supplied with a target amount of the sample; an arithmetic operator () for calculation necessary for analyzing the sample based on the first response; a determiner () for determination, based on the second response, on whether or not the reaction field has been supplied with the target amount of sample; and a controller () which makes the selector select the second voltage application state after making the selector select the first voltage application state.