The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2009

Filed:

Dec. 21, 2006
Applicant:

Takahira Kato, Novi, MI (US);

Inventor:

Takahira Kato, Novi, MI (US);

Assignee:

DENSO International America, Inc., Southfield, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 11/28 (2006.01); G01D 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one configuration, a gauge of an instrument cluster may have a base structure with an integrally molded dial structure and a separate, attached dial structure. A transparent area of the base structure may pass light from one side of the base structure to another side. This provides the ability to supply backlighting and floodlighting to the gage structure with just a single LED. The separate dial structure may be translucent to provide floodlighting or to supply light to graduations. Relative to a gauge pointer, inboard indicia in one dial structure denote vehicle speeds, while outboard graduations in another dial structure demark the indicia. The transparent portion of the base structure may be an integrally molded horizontal, angular or vertical portion within the base structure. Multiple levels and angles of the gauge provide a viewed component that is aesthetically pleasing and soothing to a viewer's eyes.


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