The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7536912 B1

PDF
Full Text
Expired
Date of Patent:
May. 26, 2009

Filed:

Jul. 18, 2007
Applicant:

Hyeung-yun Kim, Palo Alto, CA (US);

Inventor:

Hyeung-Yun Kim, Palo Alto, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 41/047 (2006.01); H01L 41/053 (2006.01);
U.S. Cl.
CPC ...
Abstract

Devices for monitoring structural health conditions of structures. A device includes a bottom substrate layer and an electrical connection layer disposed on the bottom substrate layer. The electrical connection layer includes a middle layer and a pair of generally comb-shaped electrodes disposed beneath the bottom surface of the middle layer. The device also includes one or more piezo-ceramic transducers sandwiched between the bottom substrate layer and the electrical connection layer, wherein the transducers are electrically coupled to the comb-shaped electrodes. The device also includes a top cover layer disposed on the electrical connection layer and means for communicating electrical signals to the piezo-ceramic transducers.


Find Patent Forward Citations

Kim, Hyeung-Yun. (2009). Flexible diagnostic patches for structural health monitoring (U.S. Patent No. 7536912). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7536912

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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