The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2009
Filed:
Feb. 14, 2006
Yoshihiko Satsukawa, Kawasaki, JP;
Hisashi Watanabe, Kawasaki, JP;
Yoshihiko Satsukawa, Kawasaki, JP;
Hisashi Watanabe, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
Since fault detection is not conducted for the address other than the noted address or the expected value other than the noted expected value in the RAM test, generation of a fault can be discriminated easily for the predetermined noted address or noted expected value when a fault is detected. Moreover, since the noted address is set as a single address but as the predetermined address range, when a fault is generated after the test for the relevant address range, the total number of times of test can be controlled by conducting the screening test for the address range where a fault is generated.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile