The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2009
Filed:
May. 26, 2006
Thomas R. Fay, Fort Collins, CO (US);
William H. Wubbena, Fort Collins, CO (US);
Carl E. Benvenga, Fort Collins, CO (US);
Thomas R. Fay, Fort Collins, CO (US);
William H. Wubbena, Fort Collins, CO (US);
Carl E. Benvenga, Fort Collins, CO (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
In one embodiment, test execution times are determined for a plurality of tests that are to be executed for a single unit under test (UUT). Test dependencies are also determined for the tests, as are the instruments needed to execute the tests. Then, in response to the test execution times, the test dependencies, and the instruments needed to execute the plurality of tests, a plurality of different and synchronized test execution orders for the plurality of tests are developed. Each of the test execution orders specifies a sequence of tests that is to be executed for one of a plurality of UUTs that are to be tested in parallel; and, typically, the plurality of different test execution orders will be constrained to develop different test execution orders that optimize a total time to test the plurality of UUTs, a usage cost of instruments used to test the plurality of UUTs, or both. Other embodiments are also disclosed.