The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2009
Filed:
Jun. 23, 2004
J. Kirk Haselden, Issaquah, WA (US);
Mark J. T. Durley, Sammamish, WA (US);
Matthew E. David, Sammamish, WA (US);
Sergei Ivanov, Issaquah, WA (US);
J. Kirk Haselden, Issaquah, WA (US);
Mark J. T. Durley, Sammamish, WA (US);
Matthew E. David, Sammamish, WA (US);
Sergei Ivanov, Issaquah, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Impact analysis provides the ability to determine the objects that a particular object depends on or uses, as well as determine the objects that are dependent on or use a particular object. The term object may refer to tasks and/or object types, for example. Impact analysis is desirable for improving user productivity in large, complex documents because it facilitates determining how and where an object is used by other objects in the system, thereby potentially saving a great deal of manual work.