The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2009

Filed:

Jun. 01, 2007
Applicants:

Alison Beth Ternent, Midway, KY (US);

Aditya Jayant Angal, Lexington, KY (US);

Inventors:

Alison Beth Ternent, Midway, KY (US);

Aditya Jayant Angal, Lexington, KY (US);

Assignee:

Lexmark International, Inc., Lexington, KY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03F 1/26 (2006.01); H04N 1/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for compensating for a contaminated calibration target used in calibrating a scanner having a plurality of sensor pixels includes (a) scanning a calibration target to generate a respective plurality of calibration data samples for each sensor pixel of the plurality of sensor pixels; (b) for calibration data samples associated with a current sensor pixel of the plurality of sensor pixels, removing any calibration data sample that corresponds to a region of calibration target contamination, leaving filtered calibration data samples; (c) determining a gain value for the current sensor pixel based on the filtered calibration data samples; (d) repeating acts (b) and (c) for a next sensor pixel until a respective gain value is determined for each of the plurality of sensor pixels; and (e) applying the determined gain values to the plurality of sensor pixels for use in subsequent image scanning by the scanner.


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