The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2009
Filed:
Feb. 15, 2008
Eran Steinberg, San Francisco, CA (US);
Yury Prilutsky, San Mateo, CA (US);
Peter Corcoran, Claregalway, IE;
Petronel Bigioi, Galway, IE;
Adrian Zamfir, Bucharest, RO;
Vasile Buzuloiu, Bucharest, RO;
Danutz Ursu, Bucharest, RO;
Marta Zamfir, Bucharest, RO;
Eran Steinberg, San Francisco, CA (US);
Yury Prilutsky, San Mateo, CA (US);
Peter Corcoran, Claregalway, IE;
Petronel Bigioi, Galway, IE;
Adrian Zamfir, Bucharest, RO;
Vasile Buzuloiu, Bucharest, RO;
Danutz Ursu, Bucharest, RO;
Marta Zamfir, Bucharest, RO;
FotoNation Vision Limited, Galway, IE;
Abstract
A method automatically corrects dust artifact within images acquired by a system including a digital acquisition device including a lens assembly. Multiple original digital images are acquired with the digital acquisition device. Probabilities that certain pixels correspond to dust artifact regions within the images are determined based at least in part on a comparison of suspected dust artifact regions within two or more of the images. Probable dust artifact regions are associated with extracted parameter values relating to the lens assembly when the images were acquired. A statistical dust map is formed including mapped dust regions based on the determining and associating. Pixels corresponding to correlated dust artifact regions are corrected within further digitally-acquired images based on the associated statistical dust map.