The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2009
Filed:
May. 11, 2007
Leonard John Otten, Iii, Williamsburg, VA (US);
Gavin R. G. Erry, Albuquerque, NM (US);
Leonard John Otten, III, Williamsburg, VA (US);
Gavin R. G. Erry, Albuquerque, NM (US);
Other;
Abstract
Optical instruments having, inter alia, optics to process wavelengths of electromagnetic radiation to produce an interferogram. The instruments include an optical path and optical elements positioned along this path for splitting and recombining the wavelengths which interfere with each other to produce a plurality of different fringes of different wavelengths. The optics include matched gratings which are positioned along the optical path outside of the interferometer optics to produce first and second sets of spectrally dispersed beams. The interferometer optics includes a beam splitter and first and second mirrors. In two embodiments the beam splitter has an internal surface including three zones. The instruments can all include a detector for detecting the interferogram and means for processing the detected interferogram to produce spectral information that is spatially distributed.