The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2009
Filed:
Aug. 31, 2006
Wen-hong Wu, Hsinchu, TW;
Kuo-cheng Huang, Hsinchu, TW;
Chien-shing Lee, Hsinchu, TW;
Jung-ru Yu, Hsinchu, TW;
Wen-Hong Wu, Hsinchu, TW;
Kuo-Cheng Huang, Hsinchu, TW;
Chien-Shing Lee, Hsinchu, TW;
Jung-Ru Yu, Hsinchu, TW;
Instrument Technology Research Center, Hsinchu, TW;
Abstract
A device for measuring a lens, comprising a first interferometer having a first optical axis and carried on a first adjustment base, a lens holder for holding the lens having a first surface having a first lens optical axis and a second surface having a second lens optical axis, and a platen having a sliding rail and carrying the first adjustment base and the lens holder thereon, wherein the lens holder is movable on the sliding rail, wherein each of the first adjustment base and the lens holder has a tetra-axis adjustment mechanism through which a relative positional relationship of the first optical axis of the first interferometer and the first lens optical axis of the first surface of the lens is adjustable.