The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2009

Filed:

Dec. 02, 2005
Applicants:

Yoshitaka Kamiya, Hachioji, JP;

Kenzi Murakami, Hino, JP;

Daisuke Matsuo, Hachioji, JP;

Yosuke Oka, Hachioji, JP;

Inventors:

Yoshitaka Kamiya, Hachioji, JP;

Kenzi Murakami, Hino, JP;

Daisuke Matsuo, Hachioji, JP;

Yosuke Oka, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01C 10/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an optical deflector capable of reducing a temperature drift of a strain gauge due to a temperature gradient, and detecting with high accuracy an angular displacement of a mirror surface. The optical deflector includes a movable plate, two fixed portions which are disposed at an outer side of the movable plate, two elastic supporting members which are disposed to be substantially symmetric about a center line of the movable plate, and which connect the movable plate and the two fixed portions, an angular-displacement detecting portion having a Wheatston bridge as a measuring portion which includes two active resistors, and two reference resistors, and detects an angular displacement of the movable plate, and at least one resistor element is provided on the elastic supporting portion. All of the four resistor elements are in an isothermal characteristics area.


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