The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7535243 B1

PDF
Full Text
Expired
Date of Patent:
May. 19, 2009

Filed:

Jul. 10, 2006
Applicants:

Yasushi Hashimoto, Tokyo, JP;

Takayuki Takao, Tokyo, JP;

Inventors:

Yasushi Hashimoto, Tokyo, JP;

Takayuki Takao, Tokyo, JP;

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

When first and second measuring equipment connected to switches are switched to measure multiple types of electronic characteristics of a device under test which is a semiconductor device, the device under test is disconnected from the second measuring equipment and is connected to the first measuring equipment. Thereafter, the first measuring equipment applies a voltage to the device under test via the switches so that the voltage of the first measuring equipment matches the output voltage of the second measuring equipment. The device under test is then disconnected from the first measuring equipment and is connected to the second measuring equipment for measurement.


Find Patent Forward Citations

Hashimoto, Yasushi. (2009). Method and program for controlling an apparatus for measurement of characteristics of a semiconductor device under test (U.S. Patent No. 7535243). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7535243

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