The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2009
Filed:
Jun. 17, 2005
Koichi Nakata, Toride, JP;
Akira Shimada, Sunto-gun, JP;
Tatsuya Ikezue, Toride, JP;
Takahiro Mitsui, Kashiwa, JP;
Hiroki Uematsu, Abiko, JP;
Shuji Ishii, Toride, JP;
Shoji Amamiya, Kashiwa, JP;
Akio Maruyama, Abiko, JP;
Koichi Nakata, Toride, JP;
Akira Shimada, Sunto-gun, JP;
Tatsuya Ikezue, Toride, JP;
Takahiro Mitsui, Kashiwa, JP;
Hiroki Uematsu, Abiko, JP;
Shuji Ishii, Toride, JP;
Shoji Amamiya, Kashiwa, JP;
Akio Maruyama, Abiko, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An electrophotographic photosensitive member hard to cause the problem of chatter and wear-out of the cleaning blade and the problem of a rubbing memory, and both a process cartridge and an electrophotographic apparatus having the photosensitive member are provided. The peripheral surface of the photosensitive member has a plurality of dimple-shaped concaves, a 10-point average roughness Rzjis (A) as measured by sweeping along the circumference of the peripheral surface of the photosensitive member is 0.3 to 2.5 μm, a 10-point average roughness Rzjis (B) as measured by sweeping along the generating line of the peripheral surface of the photosensitive member is 0.3 to 2.5 μm, a mean spacing of profile irregularities, RSm (C), as measured by sweeping along the circumference of the peripheral surface of the photosensitive member is 5 to 120 μm, a mean spacing of profile irregularities, RSm (D), as measured by sweeping along the generating line of the photosensitive member is 5 to 120 μm, and the value of a ratio (D/C) of the mean spacing of profile irregularities RSm (D) to the mean spacing of profile irregularities RSm (C) is 0.5 to 1.5.