The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2009
Filed:
Dec. 24, 2004
Yoshinobu Ebisawa, Hamamatsu, JP;
Yoshinobu Ebisawa, Hamamatsu, JP;
Abstract
Method and device for detecting a line-of-sight of a subject and a three-dimensional view-point measurement device. The method uses a first camera, that measures the position of a pupil relative to a coordinate system, a second camera having a light source arranged at a known position in the coordinate system, and forming a corneal reflection center to obtain data of a size of vector r from the corneal reflection center to the pupil center and an angle φ of the vector r relative to a coordinate axis of the coordinate system, and a calculation means for calculating a line-of-sight direction based on information from each camera. In determining a relational formula, a subject is made to gaze at a known point to perform measurement and a relational formula is determined. In a line-of-sight determining stage, the subject is measured again using the relational formula. A three-dimensional view-point measurement device can be configured so as to simultaneously measure the lines-of-sights of both eyes with two cameras and two light sources.